kw.\*:("Field emission ion microscopy")
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Towards the three-dimensional field ion microscopeVURPILLOT, F; GILBERT, M; DECONIHOUT, B et al.Surface and interface analysis. 2007, Vol 39, Num 2-3, pp 273-277, issn 0142-2421, 5 p.Conference Paper
Ion trajectories in atom probe field ion microscopy and gas field ion sourcesDE CASTILHO, C. M. C.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 17, pp 2261-2265, issn 0022-3727Article
Developing a method to determine linewidth based on counting the atom-spacings across a lineSILVER, R. M; JENSEN, C. P; TSAI, V et al.SPIE proceedings series. 1998, pp 441-460, isbn 0-8194-2777-2Conference Paper
Field ion specimen preparation from near-surface regionsLARSON, D. J; MILLER, M. K; ULFIG, R. M et al.Ultramicroscopy. 1998, Vol 73, Num 1-4, pp 273-278, issn 0304-3991Conference Paper
Microscopie ionique à effet de champ et sonde atomique = Field ion microscopy and atom probeBLAVETTE, Didier; MENAND, Alain.Techniques de l'ingénieur. Analyse et caractérisation. 1989, Vol P1, Num P900, pp P900.1-P900.14, issn 1762-8717Article
Field ion microscopy and beyond in some aspects of surface and nanoscience applicationsTSONG, Tien T.Surface and interface analysis. 2007, Vol 39, Num 2-3, pp 111-115, issn 0142-2421, 5 p.Conference Paper
Investigation of new aspects in the initial stages of decomposition of Cu2at.%Co with the tomographic atom probe and the field ion microscopeHEINRICH, Alexander; AL-KASSAB, Talaat; KIRCHHEIM, Reiner et al.Surface and interface analysis. 2007, Vol 39, Num 2-3, pp 240-245, issn 0142-2421, 6 p.Conference Paper
Observation of vertex-rounding transition for a crystal in equilibrium : Oxygen-covered tungstenSZCZEPKOWICZ, Andrzej; BRYL, Robert.Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 11, pp 113416.1-113416.4, issn 1098-0121Article
46th International Field Emission Symposium, 23-28 July, 2000, Pittsburgh, PA, USADANOIX, F; SEIDMAN, D. N.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2002, Vol 327, Num 1, issn 0921-5093, 121 p.Conference Proceedings
A facility for nanoscience research: An overviewSTROSCIO, J. A; HUDSON, E. W; BLANKENSHIP, S. R et al.SPIE proceedings series. 2002, pp 112-115, isbn 0-8194-4347-6, 4 p.Conference Paper
Morphological changes of Rh crystallites in the presence of adsorbed oxygenVOSS, C; KRUSE, N.Surface science. 1998, Vol 409, Num 2, pp 252-257, issn 0039-6028Article
Observation of boron enrichments in a heat-treated quasi-binary hypoeutectic NiAl-HfB2 alloy by means of atom probe field-ion microscopy (APFIM)DEGES, J; RABLBAUER, R; FROMMEYER, G et al.Surface and interface analysis. 2007, Vol 39, Num 2-3, pp 251-256, issn 0142-2421, 6 p.Conference Paper
Equilibrium shapes and energetics of iridium clusters on Ir(111)WANG, S. C; EHRLICH, G.Surface science. 1997, Vol 391, Num 1-3, pp 89-100, issn 0039-6028Article
Fabrication of Mo pyramidal-shape single atom tips covered by a noble metalLIN, Rung-Jiun; CHEN, Yi-Ju; CHEN, Hsiao-Chi et al.Applied surface science. 2014, Vol 309, pp 90-94, issn 0169-4332, 5 p.Article
Thermal reaction and stability of NiFe/Cu thin films investigated by atom probe tomographyENE, C. B; SCHMITZ, G; KIRCHHEIM, R et al.Surface and interface analysis. 2007, Vol 39, Num 2-3, pp 227-231, issn 0142-2421, 5 p.Conference Paper
Non-kinkwise field evaporation and kink relaxation on stepped W(1 1 2) surfaceMIKHAILOVSKIJ, I. M; SMITH, G. D. W; WANDERKA, N et al.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 157-163, issn 0304-3991, 7 p.Conference Paper
47th International Field Emission Symposium, 29 July-3 August 2001, Berlin, GermanyWANDERKA, Nelia; DANOIX, Frederic; FORBES, Richard G et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2003, Vol 353, Num 1-2, issn 0921-5093, 168 p.Conference Proceedings
The archetypal atom-probePANITZ, J. A.Materials characterization. 2000, Vol 44, Num 1-2, pp 3-10, issn 1044-5803Article
The development of atom probe field-ion microscopyMILLER, M. K.Materials characterization. 2000, Vol 44, Num 1-2, pp 11-27, issn 1044-5803Article
Field desorption imaging of insulator surfaces : high-resolution images of calcium fluoride epitaxial layersSEKATSKII, S. K; SEREBRYAKOV, D. V; LETOKHOV, V. S et al.Applied surface science. 1999, Vol 140, Num 1-2, pp 46-51, issn 0169-4332Article
Growth and the diffusion of platinum atoms and dimers on Pt (111)KYUNO, K; GÖLZHÄUSER, A; EHRLICH, G et al.Surface science. 1998, Vol 397, Num 1-3, pp 191-196, issn 0039-6028Article
Field Emission '97 International Field Emission SymposiumHONO, K; TSUKADA, M.Ultramicroscopy. 1998, Vol 73, Num 1-4, issn 0304-3991, 305 p.Conference Proceedings
3D atom probe study of gas adsorption and reaction on alloy catalyst surfaces II Results on Pt and Pt-RhBAGOT, P. A. J; CEREZO, A; SMITH, G. D. W et al.Surface science. 2007, Vol 601, Num 10, pp 2245-2255, issn 0039-6028, 11 p.Article
Atom probe field ion microscopy investigation of boron containing martensitic 9 pct chromium steelHOFER, P; MILLER, M. K; BABU, S. S et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2000, Vol 31, Num 3, pp 975-984, issn 1073-5623Article
FIM studies of clean and graphitized rhodium using lithium and oxygen as imaging speciesMEDVEDEV, V. K; SUCHORSKI, Yu; VISART DE BOCARME, T et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 239-244, issn 0304-3991Conference Paper